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Test equipment

Contributors in Test equipment

Test equipment

force

Semiconductors; Test equipment

To stimulate DUT pins with formatted pattern data.

inhibit

Semiconductors; Test equipment

To turn off a driver, placing it in a state that approximates an open circuit.

tolerance

Semiconductors; Test equipment

Tolerance is the deviation allowed for a component ( for example, R,C,gm,Cgs,etc. ) of its measured output, such as voltage magnitude. For component variation, tolerance is the deviation of an ...

Automatic Test Pattern Generation (ATPG)

Semiconductors; Test equipment

Tool-based approach to test pattern or program development that relies heavily on the design database. DFT and ATPG go hand-in-hand.

image processing

Semiconductors; Test equipment

Transforming a source image into an improved image that supplies specific properties. For example, edge detection is an image-processing method.

fault equivalence

Semiconductors; Test equipment

Two faults are said to be equivalent if their effects on the output cannot be distinguished from each other.

fault masking

Semiconductors; Test equipment

Two faults are said to be mask each other if their sensitivities are equal and opposite in sign.

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