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Test equipment

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Test equipment

memory module

Semiconductors; Test equipment

The memory module, of which there may be two per board, contains either 18 M or 72 M of memory. This memory can be used for DBM, ECR or Vector testing.

intermodulation

Semiconductors; Test equipment

The mixing of two signals in a nonlinear device. This produces signals at frequencies that are the sum and difference of integral multiples of the original signals.

uniform resource locator (URL)

Semiconductors; Test equipment

The name (or string of characters) that uniquely identifies each Web site. For example, www. tmworld.com.

PC card

Semiconductors; Test equipment

The name of version 3.0 of the PCMCIA form factor.

noise distortion

Semiconductors; Test equipment

The nonlinear behavior that circuits or devices exhibit when driven with a broadband noise signal.

polarization

Semiconductors; Test equipment

The orientation of the field vector in a radiated field.

pattern vector

Semiconductors; Test equipment

The pattern data applied to and expected from a DUT during one test cycle.

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