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Test equipment
Industry: Semiconductors
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Test equipment
memory module
Semiconductors; Test equipment
The memory module, of which there may be two per board, contains either 18 M or 72 M of memory. This memory can be used for DBM, ECR or Vector testing.
intermodulation
Semiconductors; Test equipment
The mixing of two signals in a nonlinear device. This produces signals at frequencies that are the sum and difference of integral multiples of the original signals.
uniform resource locator (URL)
Semiconductors; Test equipment
The name (or string of characters) that uniquely identifies each Web site. For example, www. tmworld.com.
noise distortion
Semiconductors; Test equipment
The nonlinear behavior that circuits or devices exhibit when driven with a broadband noise signal.
polarization
Semiconductors; Test equipment
The orientation of the field vector in a radiated field.
pattern vector
Semiconductors; Test equipment
The pattern data applied to and expected from a DUT during one test cycle.