5 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
defect level
Semiconductors; Test equipment
The fraction of devices shipped, which can be expected to be defective (ie. escapes) due to incomplete test coverage. Usually expressed as a percentage number.
frame rate
Semiconductors; Test equipment
The frequency at which an image is completely updated on a display monitor.
quantizing error
Semiconductors; Test equipment
The inherent uncertainty in digitizing an analog value that is caused by the finite resolution of the conversion process. Increasing the resolution of an ADC reduces the uncertainty.
convolution
Semiconductors; Test equipment
The integration of the product of two functions in time. Convolution in the time domain is equivalent to multiplication in the frequency domain.
throughput rate
Semiconductors; Test equipment
The maximum repetitive rate at which a data-conversion system can operate with a specified accuracy.
parametric test
Semiconductors; Test equipment
The measurement and verification of terminal voltage and current characteristics at a device pin.
field strength
Semiconductors; Test equipment
The measurement of either the electric field or the magnetic field that is made in the far field. (Expressed in units of V/m, A/m, or W/m.)
