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Test equipment

Contributors in Test equipment

Test equipment

design for automatic test pattern generation (DFATPG)

Semiconductors; Test equipment

The action of applying design rules to a chip design to ensure that an ATPG tool can successfully generate vectors and achieve a targeted quality level.

design for debug (DFD)

Semiconductors; Test equipment

Design-for-Debug. The use of on-chip instrumentation, with specialized EDA software, to detect, diagnose, and debug functional errors in SoC's.

design for manufacturing for integrated circuits (DFM for ICs)

Semiconductors; Test equipment

Achieving high-yielding designs in the state of the art, VLSI technology has become an extremely challenging task due to the miniaturization as well as the complexity of leading-edge products. The ...

design rules for test

Semiconductors; Test equipment

(DFT Rules) - The set of design restrictions placed on a design description for the test process. These rules are applied to ease the vector generation process (manual or ATPG); to enhance the ...

design for testability (DFT)

Semiconductors; Test equipment

A philosophy and activity whereby the designer of a circuit takes into account the method used to test the circuit and designs the product in a manner which will reduce the cost and effort of ...

design for X (DFX)

Semiconductors; Test equipment

A generic name for the members of a family of methodologies adopted for improve the project and conception of a product for a determined objective (as cost, assembly facility, repairing or other), of ...

design for yield (DFY)

Semiconductors; Test equipment

A Design for Manufacturing (DFM) technique which alters the design in a manner that is more likely to produce higher chip yields.

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