Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

erasable programmable read only memory (EPROM)

Semiconductors; Test equipment

An integrated circuit that stores p rograms and data in many embedded systems. EPROM can only be programmed once. To erase an EPROM's contents, it must be exposed to intense ultraviolet light for ...

internet protocol (IP)

Semiconductors; Test equipment

The protocol in TCP/IP that governs the breakup of data messages into packets, the routing of the packets from sender to destination network and station, and the reassembly of the packets into the ...

instruction register scan

Semiconductors; Test equipment

(IR scan) - A scan operation that includes shifting new data into instruction registers from the TDI buffers and shifting captured data out into the TDO buffers while the TAP controller is in ...

infrared (IR)

Semiconductors; Test equipment

Electromagnetic heat radiation whose frequencies are above the microwave frequency band and below red in the visible band.

instruction register (IR)

Semiconductors; Test equipment

The IR selects the test to perform and/or the test data register to access, and also allows shifting out of the status information.

infrared data association (IrDA)

Semiconductors; Test equipment

The industry organization of computer, component, and telecommunications vendors who have established the standards for infrared communication between computers and peripheral devices such as ...

industry standard architecture bus (ISA bus)

Semiconductors; Test equipment

A bus standard for PCs introduced in 1984 that extended the XT bus architecture to 16 bits. It is designed to connect peripheral cards to the motherboard. It is also referred to as the AT bus.