Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

electromotive force (emf)

Semiconductors; Test equipment

Force that causes the motion of electrons due to potential difference between two points. (voltage)

electromagnetic interference (EMI)

Semiconductors; Test equipment

Any electromagnetic disturbance that interrupts, obstructs, or otherwise degrades or limits the effective performance of electronics/electrical equipment. It can be induced intentionally, as in some ...

electromagnetic pulse (EMP)

Semiconductors; Test equipment

A broadband, high-intensity, short-duration burst of electromagnetic energy. In the case of nuclear detonations, the electromagnetic pulse signal consists of a continuous spectrum with most of its ...

electromagnetic radiation (EMR)

Semiconductors; Test equipment

The emission of energy in the form of electromagnetic waves. It consists of oscillating electric and magnetic fields propagating at the speed of light. It includes gamma radiation, X-rays, ...

electromagnetic vulnerability (EMV)

Semiconductors; Test equipment

The characteristics of electrical or electronic equipment/systems that cause it to suffer degradation or failure in performance as a result of electromagnetic interference.

end of frame (EOF)

Semiconductors; Test equipment

End of Frame

electrical overstress (EOS)

Semiconductors; Test equipment

Electrical OverStress is a transient or steady state electrical condition that exceeds the specifications and/or capabilities of a device. Both the magnitude and duration of an EOS event can vary. ...