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Test equipment
Industry: Semiconductors
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Test equipment
single-event upsets (SEU)
Semiconductors; Test equipment
Soft errors in memory cells caused either by hardware problems, such as single event latch-ups (SELs) or by some external radiation.
spurious free dynamic range (SFDR)
Semiconductors; Test equipment
The ratio of the specified maximum signal level capability of the signal generator to its noise.
super high frequency (SHF)
Semiconductors; Test equipment
Frequency band between 3 GHz and 30 GHz. So desiganted by Federal Communications Comission (FCC).
system health management (SHM)
Semiconductors; Test equipment
The capability of monitoring real-time sensors to determine system health and performance.
safe high voltage (SHV)
Semiconductors; Test equipment
A type of connector used with BNC cables for safe connection to high voltage sources. The connector uses a bayonet mount similar to those of BNC connectors, but it is easily distinguished due to its ...
single inline memory module (SIMM)
Semiconductors; Test equipment
Type of memory package used to increase memory density on the printed circuit board.
server I/O module (SIOM)
Semiconductors; Test equipment
An I/O module, designed for server and workstation applications, that uses PCI Express for communication.
