Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

differential interference contrast (DIC)

Semiconductors; Test equipment

A mode of contrast generation in microscopy that yields an image with a shadow relief. The relief reflects the gradient of optical path difference. DIC, which is a form of interference microscopy ...

dual In-line (DIL)

Semiconductors; Test equipment

Component shape with two parallel rows of connection leads.

dynamic link library (DLL)

Semiconductors; Test equipment

A library which is linked to application programs when they are loaded or run rather than as the final phase of compilation. This means that the same block of library code can be shared between ...

depot level maintenance (DLM)

Semiconductors; Test equipment

Maintenance in which the faulty SRU is tested to determine the cause of the malfunction. Faulty components are removed and replaced, and the SRU is verified ready for service by successful ...

The OSI level that performs the assembly and transmission of data packets (gets data packets on and off the wire), does error detection and correction, synchronization and retransmission. It includes ...

digital multimeter (DMM)

Semiconductors; Test equipment

The digital multi-meter is an instrument capable of measuring several electrical parameters in various ranges.

differential nonlinearity (DNL)

Semiconductors; Test equipment

A measure in LSB of the worst-case deviation of code widths from their ideal value of 1 LSB. A DNL lower limit specification of -1 LSB guarantees no missing codes. A maximum code width can be ...