Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

embedded boundary scan test (EBST)

Semiconductors; Test equipment

Embedded BST means that an Embedded Test Controller based on an available processor located within the UUT becomes responsible for executing test and configuration operations. The controller uses a ...

electrocardiograph (ECG )

Semiconductors; Test equipment

An instrument used to make heartbeat measurements

emitter coupled logic (ECL)

Semiconductors; Test equipment

Logic gates implemented using particular configurations of bipolar junction transistors. Generally used for high-speed applications.

effective competitive opportunities test (ECO test)

Semiconductors; Test equipment

Developed to determine whether U.S. carriers enjoy effective competition in a foreign carrier's market before granting U.S. market access to that foreign carrier. Following the Basic Telecom ...

electronic design interchange format (EDIF)

Semiconductors; Test equipment

An industry-standard netlist format used when passing information between different software tools.

extended data out DRAM (EDO DRAM)

Semiconductors; Test equipment

Type of Dynamic Random Access Memory (DRAM) that is faster than conventional DRAM.

embedded deterministic test (EDT)

Semiconductors; Test equipment

A patented DFT technology from Mentor Graphics that creates highly compressed test vectors through the combination of embedding test logic in the scan paths and specialized deterministic test ...