Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

known good die (KGD)

Semiconductors; Test equipment

A die in IC construction that can be used as a reference for comparing die not yet tested.

LabVIEW field programmable gate array (LabVIEW FPGA)

Semiconductors; Test equipment

A feature available with National Instrument's (NI's) LabVIEW 7 software that allows users to creates custom FPGA applications to run on NI reconfigurable I/O hardware.

A network interconnecting devices in the same office, floor, or building, or areas inside buildings with areas just outside. A group of PCs and other devices dispersed over a relatively limited area ...

leadless ceramic chip carrier or ceramic leadless chip carrier (LCCC)

Semiconductors; Test equipment

A hermetically sealed ceramic package that has pads (castellations) around its sides for solder connection in a surface mounting application.

loop current step response (LCSR)

Semiconductors; Test equipment

The LCSR test involves heating the sensing element of the temperature sensor with an electric current. For RTDs, a DC current goes to the RTD extension leads to cause internal heating in the RTD ...

leaded ceramic chip carrier (LDCC)

Semiconductors; Test equipment

A hermetically sealed ceramic package that has leads around its sided for solder connection in a surface mounting application. Typically, thee packages have over 28 leads.