Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

last In first out (LIFO)

Semiconductors; Test equipment

A memory device in which data is read out in the reverse order to which it was written in.

local interconnect network (LIN)

Semiconductors; Test equipment

LIN is a single-wire serial communications protocol based on the common SCI (UART) byte-word interface. UART interfaces as available as low cost silicon module on almost all micro-controller and can ...

local oscillator (LO)

Semiconductors; Test equipment

The oscillator generating the heterodyning frequency for the mixer stage(s). The abbreviation LO is also used to indicate the frequency of the heterodyning signal (e.g. 1st LO). In fundamental ...

logic modeling

Semiconductors; Test equipment

(LogMod) - The name used by Ralph A. Depaul, Jr. to refer to the causal modeling technique that he invented in the 1950s and which would later become known as dependency modeling.

loss of life (LOL)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of life and is specified as a level 5 criticality in the FMECA.

loss of mission (LOM)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of mission or operation and is specified as a level 3 criticality in the FMECA.

level of repair analysis (LORA)

Semiconductors; Test equipment

An analytical methodology used to assist in developing maintenance concepts and establishing the maintenance level at which components will be replaced, repaired, or discarded based on ...