Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

qualified products list (QPL)

Semiconductors; Test equipment

A listing of manufacturers qualified by test and performance verification to produce items listed in military (MIL) specifications.

quadrature phase-shift keying (QPSK)

Semiconductors; Test equipment

A method of modulating digital signals using four phase states to code two digital bits per phase shift.

quarter-size small outline package (QSOP)

Semiconductors; Test equipment

An SO style IC package that has leads on a 25 mil pitch. The name derives from the fact that the package is approximately ½ the length and ½ the width of a standard SOIC, and thus a package of the ...

resistance (R)

Semiconductors; Test equipment

Symbolized "R" and measured in ohms. Opposition to current flow and dissipation of energy in the form of heat.

return-to-one

Semiconductors; Test equipment

(R1) - In effect, the inverse of RZ. Unlike the other formats in this list, R1 assumes the cycle begins with a “1”, then switches to a “0” when the bit is valid, then switches back to a “1” before ...

random access memory (RAM)

Semiconductors; Test equipment

A type of computer memory that can be accessed randomly; that is, any byte of memory can be accessed without touching the preceding bytes. RAM is the most common type of memory found in computers and ...

reliability block diagram (RBD)

Semiconductors; Test equipment

A diagram the represents how the components (represented by "blocks") are arranged and related reliability-wise in a larger system. This is often, but not necessarily, the same as the way that the ...