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Test equipment
Industry: Semiconductors
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Test equipment
printed wiring assembly (PWA)
Semiconductors; Test equipment
The generic term for a PWB after all electrical components have been attached.
printed wiring board (PWB)
Semiconductors; Test equipment
A part manufactured from rigid base material upon which completely processed printed wiring has been formed.
pulse-width modulation (PWM)
Semiconductors; Test equipment
Often used in digital audio systems. As its name implies, it is applicable to pulse waveforms only. With PWM, the modulating signal causes the active pulse width (duty cycle, explained earlier) of ...
PCI extensions for instrumentation (PXI)
Semiconductors; Test equipment
A rugged PC-based platform for measurement and automation systems. PXI combines PCI electrical-bus features with the rugged, modular, Eurocard packaging of CompactPCI, and then adds specialized ...
quiescent point
Semiconductors; Test equipment
(Q point) - A point on the DC load line of a given amplifier that represents the quiescent (no signal) value of output voltage and current for the circuit.
quality factor (Q)
Semiconductors; Test equipment
For BAND-PASS and BAND-REJECT filters Q = Fo/BW. Note that Fo is the GEOMETRIC CENTER and BW is the BAND WIDTH.
amplification factor (Q)
Semiconductors; Test equipment
The amount of mechanical gain of a structure when excited at a resonant frequency. The ratio of the amplitude of the steady state solution (amplitude at resonance) to the static deflection for the ...
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