11 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
personal area network (PAN)
Semiconductors; Test equipment
A term popularized to describe how Bluetooth enables a collection of personal electronic devices to operate together as a logical collective.
pipeline operation altering thread (PAT)
Semiconductors; Test equipment
A pre-compiled list of PC ImageFlow operations which define a particular collection of pipelined operations. PATs can be executed extremely quickly and are used to configure and reconfigure image ...
plastic ball grid array (PBGA)
Semiconductors; Test equipment
A ball grid array component whose package substrate is made of plastic, most likely an FR-4 equivalent of epoxy-fiberglass, polyimide-arramid, or similar resin-fiber combinations.
power-up BIT (PBIT)
Semiconductors; Test equipment
Comprehensive tests of hardware functionality extending as close to the edge of a module as possible.
positive bias temperature instability (PBTI)
Semiconductors; Test equipment
A failure mechanism in ICs that is similar to NBTI, except that it happens on a PFET rather than an NFET
printed circuit assembly (PCA)
Semiconductors; Test equipment
The generic term for a PCB after all electrical components have been attached. Also referred to as a printed wiring assembly (PWA).
printed circuit board (PCB)
Semiconductors; Test equipment
A part manufactured from a rigid base material upon which a completely processed printed circuit has been formed.
