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Test equipment

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Test equipment

programmable logic device (PLD)

Semiconductors; Test equipment

The generic name for a device constructed in such a way that the designer can configure, or "program" it to perform a specific function.

mega (M)

Semiconductors; Test equipment

Represents one million (1,000,000). For example, 1MHz = 1,000,000 Hz

mutation analysis (MA)

Semiconductors; Test equipment

A field of computer science involving the mutation of source code by introducing statements or modifying existing statements in small ways. The mutations are based on well-defined mutation operators ...

molecular beam epitaxy (MBE)

Semiconductors; Test equipment

A technique for creating thin films on substrates in precise patterns, in which the substrate is placed in a high vacuum, and a guided beam of ionized molecules is fired at it, effectively allowing ...

model based reasoner (MBR)

Semiconductors; Test equipment

An algorithm that creates diagnostic conclusions by comparing measured values against propositions created from a model that is dynamically adjusted to match changes to the system.

mission capable (MC)

Semiconductors; Test equipment

An assessment of a system’s ability to perform its required tasks, in either a Fully Mission Capable (FMC) or Partially Mission Capable (PMC) status.

multichip module (MCM)

Semiconductors; Test equipment

A circuit comprised of two or more silicon devices bonded directly to a substrate by wire bond, TAB, of flip chip.

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