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Test equipment
Industry: Semiconductors
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Test equipment
programmable logic device (PLD)
Semiconductors; Test equipment
The generic name for a device constructed in such a way that the designer can configure, or "program" it to perform a specific function.
mega (M)
Semiconductors; Test equipment
Represents one million (1,000,000). For example, 1MHz = 1,000,000 Hz
mutation analysis (MA)
Semiconductors; Test equipment
A field of computer science involving the mutation of source code by introducing statements or modifying existing statements in small ways. The mutations are based on well-defined mutation operators ...
molecular beam epitaxy (MBE)
Semiconductors; Test equipment
A technique for creating thin films on substrates in precise patterns, in which the substrate is placed in a high vacuum, and a guided beam of ionized molecules is fired at it, effectively allowing ...
model based reasoner (MBR)
Semiconductors; Test equipment
An algorithm that creates diagnostic conclusions by comparing measured values against propositions created from a model that is dynamically adjusted to match changes to the system.
mission capable (MC)
Semiconductors; Test equipment
An assessment of a system’s ability to perform its required tasks, in either a Fully Mission Capable (FMC) or Partially Mission Capable (PMC) status.
multichip module (MCM)
Semiconductors; Test equipment
A circuit comprised of two or more silicon devices bonded directly to a substrate by wire bond, TAB, of flip chip.
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