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Test equipment
Industry: Semiconductors
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Test equipment
mean time between critical failure (MTBCF)
Semiconductors; Test equipment
The mean time between failures of mission-essential functions, calculated as the ratio of active hours (those excluding scheduled maintenance) and the number of critical failures.
mean time between downing events (MTBDE)
Semiconductors; Test equipment
A measure calculated as the total uptime over the number of downing events.
mean-time-between-failure (MTBF)
Semiconductors; Test equipment
The arithmetic or statistical mean average time interval, usually in hours, that may be expected between failures of an operating unit. Results should be designated actual, predicted, or calculated.
mean time between maintenance actions (MTBMA)
Semiconductors; Test equipment
A ratio of the total uptime over the number of scheduled and unscheduled maintenance events.
mean time between preventative maintenance (MTBPM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of preventative maintenance events.
mean time between scheduled maintenance (MTBSM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of scheduled maintenance events.
mean time between unscheduled maintenance (MTBUM)
Semiconductors; Test equipment
A ratio of the total uptime over the number of unscheduled maintenance events.
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