Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

numerical aperture (NA)

Semiconductors; Test equipment

A term representative of the angle included by a cone of light accepted by the objective of a microscope. The higher the NA, the greater the resolving power.

no fault found (NFF)

Semiconductors; Test equipment

The event that results from a failure or fault being detected or reported during operations that cannot be verified at the lower level of maintenance.

national institute of standads and technology (NIST)

Semiconductors; Test equipment

A non-regulatory agency of the United States Department of Commerce, NIST supplies standard reference materials of the highest quality and metrological value.

N-channel MOS or P-channel MOS (NMOS or PMOS)

Semiconductors; Test equipment

Refers to the order in which the semiconductor is doped in a MOS device. That is, which structures are constructed as N-type versus P-type material.

normal mode rejection (NMR)

Semiconductors; Test equipment

The amount of signal rejection at a certain frequency. Typically the frequency of the rejection is designed for electrical power frequencies such as 50 or 60 Hz.

nondeterministic polynomial-time hard (NP-hard)

Semiconductors; Test equipment

In computational complexity theory, is a class of problems informally "at least as hard as problems in NP." A problem H is NP-hard if and only if there is an NP-complete problem L that is polynomial ...