Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

forward error correction (FEC)

Semiconductors; Test equipment

methodology that uses error correction coding to transmission. This is the opposite of ARQ (automatic repeat request) which uses retransmission of data. FEC CODE: RATE 1/3 is a simple Forward Error ...

field effect transistor (FET)

Semiconductors; Test equipment

A transistor whose control, or gate, signal creates an electro-magnetic field which turns the transistor ON or OFF.

fraction of false alarm (FFA)

Semiconductors; Test equipment

The percentage of fault detections that are not due to the existence of faults.

functional failure mode effects analysis (FFMEA)

Semiconductors; Test equipment

A FMEA that identifies the potential impact of each functional failure mode on mission success.

fine pitch ball grid array package (FG)

Semiconductors; Test equipment

A leadless, surface mounted package that is over 50% smaller than traditional BGA for similar pin counts.

functional hazard analysis (FHA)

Semiconductors; Test equipment

An analysis of the effects, risk, severity and probability of potential faults that is performed during the specification and design stages, typically before failure modes are identified. The FHA ...

fault isolation (FI)

Semiconductors; Test equipment

The process of identifying the faulty replaceable unit or group of units, whose replacement will repair the system. The replaceable unit in a system is the module(s); in a module, the board(s); on a ...