Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

center frequency (Fo)

Semiconductors; Test equipment

Defined for BAND-PASS and BAND-REJECT filters as the frequency at the geometric mean of two corner frequencies (usually -3 dB).

geometric center frequency (Fo)

Semiconductors; Test equipment

Fo = Square root of (Fc1*Fc2) where Fc is a Corner Frequencey. Used to specify Fo for band-pass or band-reject filters.

flat pack (FP)

Semiconductors; Test equipment

A low profile IC package, which typically has gull wing type of leads on two or four sides.

flexible printed circuit (FPC)

Semiconductors; Test equipment

A specialist circuit board technology, often abbreviated to "flex", in which tracks are printed onto flexible materials. There are a number of flavors of flex, including static flex, dynamic flex, ...

failure propagation graph (FPG)

Semiconductors; Test equipment

A directed graph which represents the propagation of failures in the system. The vertices of such a graph consist of failure modes, discrepancies and sensor states. The edges in the graph represent ...

field programmable gate array (FPGA)

Semiconductors; Test equipment

A device that can be reprogrammed to a different application even after it has been placed on the board. The JTAG bus is usually used as a portal to reprogram the device.

field programmable interconnect device (FPID)

Semiconductors; Test equipment

A device which is used to connect logic devices together, and which can be dynamically reconfigured in the same way as standard SRAM-based FPGAs. Because each FPID may have around 1,000 pins, only a ...