Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

giga (G)

Semiconductors; Test equipment

Represents one thousand million, or 1,000,000,000. Typically used to measure frequency in Hertz, but now measures the amount of memory in modern personal computers.

hardware In the loop (HIL)

Semiconductors; Test equipment

Hardware-in-the-loop simulation is a term used whenever real-world hardware is added to a software simulation to emulate the operation of an electro-mechanical system.

A relatively complex computer programming language that allows the programmer to work at a mathematically abstract level instead of the low, physical level of the microprocessor or microcontroller. ...

health management (HM)

Semiconductors; Test equipment

The capability of monitoring real-time sensors to determine the health and performance of a system, subsystem, device or process. It may or may not be hosted on the system being monitored.

Hewlett-Packard interface bus (HPIB)

Semiconductors; Test equipment

Another name for the GPIB interface, see also IEEE-488.

high speed 488

Semiconductors; Test equipment

(HS488) - A high-speed data transfer protocol for IEEE 488. This protocol increases performance for GPIB reads and writes up to 8 Mbytes/s, depending on your system.

hierarchical scan description language (HSDL)

Semiconductors; Test equipment

Developed by Texas Instruments this superset of the Boundary Scan Description Language (BSDL) provides information about board-level and system-level interconnection of IEEE-1149.1 signals.