Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

high speed serial interface (HSSI)

Semiconductors; Test equipment

The HSSI interface uses differential ECL lines to transmit data at 52Mbps out to a maximum distance of 50 feet, also EIA613.

hypertext transfer protocol

Semiconductors; Test equipment

(http) - The protocol used to transfer Web pages between a Web Server and a browser. A set of instructions for communications between a server and a world wide web client. It is the main protocol ...

input/output (I/O)

Semiconductors; Test equipment

I/O refers to any operation, program, or device whose purpose is to enter data into a computer or to extract data from a computer.

(I2C or IIC) - A serial interface useful for communicating with other peripheral or microcontroller devices. The I2C module contains independent I2C master logic and I2C slave logic, each generating ...

I/O buffer information specification (IBIS)

Semiconductors; Test equipment

A standard simulation format used to model the behavior of an integrated circuit's input/output (I/O) pins. Used in designing and simulating the operation of circuit buses.

initiated BIT (IBIT)

Semiconductors; Test equipment

Usually invoked following a failure, IBIT initiates tests to isolate a fault within a system or subsystem. In general, IBIT will halt the current application, run its tests, and either resume or ...

integrated circuit (IC)

Semiconductors; Test equipment

A circuit housed in a chip form. The two main IC configurations are through-hole (with pins that penetrate across the circuit board) and surface mount technology (SMT), which mount on the surface of ...