Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

equivalent time sampling (ETS)

Semiconductors; Test equipment

Equivalent-time sampling is a method of reconstructing the signal based on a series of triggered waveforms that are each acquired in single shot mode. The advantage of ETS is that it offers a higher ...

engineering units (EU)

Semiconductors; Test equipment

The units in which a measurement is made; for instance velocity may be expressed in millimeters per second, miles per hour, or furlongs per fortnight, depending on the use to which the data will be ...

equipment under test (EUT)

Semiconductors; Test equipment

The electronic device which is currently tested for immunity or emission.

femto (F)

Semiconductors; Test equipment

A unit of measure, typically used in expressing capacitance. One femto Farad (fF) is equal to 0.000000000000001 Farad. In other words it is one thousandth of one millionth of one millionth, or 10-15.

farad (F)

Semiconductors; Test equipment

The basic unit of capacitance. One Farad, however, is so large that in most electronics circuits microFarad (uF) and picoFarad (pF) capacitors are more common.

silicon wafer fabrication facility (fab)

Semiconductors; Test equipment

The manufacturing plant in which blank silicon wafers are processed to create finished wafers. A wafer is a round slice of a silicon ingot on which many chips are manufactured simultaneously.

corner frequency (Fc)

Semiconductors; Test equipment

The transition frequency range between the PASS-BAND and STOP-BAND. For Butterworth and Bessel type filters this would be the frequency where the signal is –3.01 dB with reference to the PASS-BAND ...