Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

media delivery index (MDI)

Semiconductors; Test equipment

In video transmission over the internet, it provide useful insights into what is happening to a video data stream as it winds through the network. The MDI has two components: the Delay Factor (DF) ...

mean downtime (MDT)

Semiconductors; Test equipment

The average elapsed time between losing Mission Capable status and restoring the system to at least partially mission capable status. Calculated as the ratio of total downtime over the number of ...

metal electrode face bonding (MELF)

Semiconductors; Test equipment

A cylindrical leadless component with a round body and metals terminals on the ends.

manufacturing for design (MFD)

Semiconductors; Test equipment

Any technique used by the chip manufacturer to tailor the processes for a particular design to improve production yield. These techniques usually take the form of specific process recipe settings or ...

megahertz

Semiconductors; Test equipment

(MHz) - One MegaHertz (MHz) represents one million cycles per second. The speed of microprocessors, called the clock speed, is measured in megahertz.

multiple input / multiple output communication (MIMO)

Semiconductors; Test equipment

an abstract mathematical model for multi-antenna communication systems where the transmitter has multiple antennas capable of transmitting independent signals and the receiver is equipped with ...

million instrictions per second (MIPS)

Semiconductors; Test equipment

An old measure of a computer's speed and power, MIPS measures roughly the number of machine instructions that a computer can execute in one second. However, different instructions require more or ...