Test equipment

Test equipment

Industry: Semiconductors

Add a new term

Contributors in Test equipment

Become a Contributors

Test equipment

phase

Semiconductors; Test equipment

(Of a periodic quantity), the fractional part of a period between a reference time (such as when displacement = zero) and a particular time of interest; or between two motions or electrical ...

orthogonal frequency division multiplexing (OFDM)

Semiconductors; Test equipment

Single high-frequency carrier is replaced by multiple subcarriers, each operating at a significantly lower frequency. It is a special method of multi-carrier modulation. Like all wireless ...

organisation internationale de metrologie legale (OIML)

Semiconductors; Test equipment

International organisation for legal measuring

operational maintenance

Semiconductors; Test equipment

(O-Level Maintenenace) - Maintenance in which the repair action consists of the removal and replacement of the malfunctioning assembly (LRU, black box, equipment). In both two and three-level ...

on-chip emulation (OnCE)

Semiconductors; Test equipment

A Freescale JTAG command which makes a TAP enter a special mode where the IR holds OnCE debugging commands for operations such as single stepping, breakpointing, and accessing registers or memory.

operational amplifier (OpAmp)

Semiconductors; Test equipment

A high gain DC amplifier that has a high input impedance and a low output impedance. Op-amps are the most basic type of linear integrated circuits

operational verification (Op-Ver)

Semiconductors; Test equipment

Typically subsets of the performance tests. The purpose of operational verification tests is to verify instrument operation quickly with reasonable confidence. Operation verification procedures ...