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Test equipment
Industry: Semiconductors
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Test equipment
phase
Semiconductors; Test equipment
(Of a periodic quantity), the fractional part of a period between a reference time (such as when displacement = zero) and a particular time of interest; or between two motions or electrical ...
orthogonal frequency division multiplexing (OFDM)
Semiconductors; Test equipment
Single high-frequency carrier is replaced by multiple subcarriers, each operating at a significantly lower frequency. It is a special method of multi-carrier modulation. Like all wireless ...
organisation internationale de metrologie legale (OIML)
Semiconductors; Test equipment
International organisation for legal measuring
operational maintenance
Semiconductors; Test equipment
(O-Level Maintenenace) - Maintenance in which the repair action consists of the removal and replacement of the malfunctioning assembly (LRU, black box, equipment). In both two and three-level ...
on-chip emulation (OnCE)
Semiconductors; Test equipment
A Freescale JTAG command which makes a TAP enter a special mode where the IR holds OnCE debugging commands for operations such as single stepping, breakpointing, and accessing registers or memory.
operational amplifier (OpAmp)
Semiconductors; Test equipment
A high gain DC amplifier that has a high input impedance and a low output impedance. Op-amps are the most basic type of linear integrated circuits
operational verification (Op-Ver)
Semiconductors; Test equipment
Typically subsets of the performance tests. The purpose of operational verification tests is to verify instrument operation quickly with reasonable confidence. Operation verification procedures ...
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