Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

reactive maintenance (RM)

Semiconductors; Test equipment

A Maintenance Event performed in response to a failure. Also called Fault-Induced or Corrective Maintenance. Although this "run it until it breaks" maintenance mode is still practiced, it is very ...

negative bias temperature instability (NTBI)

Semiconductors; Test equipment

NBTI is a key reliability issue that is of immediate concern in CMOS devices enduring stress from negative-gate voltages. The driving current to a transistor becomes smaller, degrading or locking up ...

master test controller (NTC)

Semiconductors; Test equipment

In a system where the control and execution of test functions may be delegated to multiple embedded Test Controllers, e.g. for parallelism, a Master Test Controller will coordinate the activities of ...

next generation automatic test systems integrated product team (NxTest IPT)

Semiconductors; Test equipment

In April 2002, the DoD Automatic Test Systems (ATS) Executive Agent Office formally chartered the NxTest IPT – made up representatives from the Air Force, Army, Marine Corps and Navy – with two main ...

operating & support (O&S)

Semiconductors; Test equipment

The phase of a system's life cycle during which it is operated and maintained.

open area test site (OATS)

Semiconductors; Test equipment

A test facility location, free of reflecting objects except a ground plane, where radiated emission tests may be carried out per CISPR 22 (FCC, Parts.15B, EN55022 and other test standards). A site ...