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Test equipment

Contributors in Test equipment

Test equipment

milli

Semiconductors; Test equipment

(m) - Representing one thousandth = 0.001. For example, 1 thousandth of a second (1 millisecond) could be written as 1 ms or 1 mS.

phase locked loop (PLL)

Semiconductors; Test equipment

An analog circuit used to perform clock management functions on and off-chip.

product lifecycle management (PLM)

Semiconductors; Test equipment

Used to track products as they're developed, to "manage the mountains of data surrounding engineering changes," and finally "to feed product information to enterprise resource planning (ERP) ...

phase modulation (PM)

Semiconductors; Test equipment

In a phase modulated signal, the reference phase of the carrier varies in proportion to the instantaneous amplitude of the modulating baseband signal. This is similar to FM, but the frequency ...

partially mission capable (PMC)

Semiconductors; Test equipment

The system is operating in an impaired condition. It can perform at least one, but not all of its assigned missions.

pseudo noise (PN)

Semiconductors; Test equipment

A digital signal with noise-like properties.

proof of concept (POC)

Semiconductors; Test equipment

Proof-of-concept is a short and/or incomplete realization (or synopsis) of a certain method or idea(s) to demonstrate its feasibility, or a demonstration in principle, whose purpose is to verify that ...

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