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Test equipment

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Test equipment

physics of failure analysis (POF)

Semiconductors; Test equipment

A term for identifying and understanding the physical processes and mechanisms of failure.

post office protocol (POP)

Semiconductors; Test equipment

A protocol used to retrieve e-mail from a mail server. Most e-mail applications (sometimes called an e-mail client) use the POP protocol, although some can use the newer IMAP (Internet Message Access ...

power on self test (POST)

Semiconductors; Test equipment

A diagnostic testing sequence run by a computer’s BIOS as the computer’s power is initially turned on. The POST will determine if the computer’s RAM, disk drives, peripheral devices and other ...

potentiometer (pot)

Semiconductors; Test equipment

A variable resistor with three terminals. Mechanical turning of a shaft can be used to produce variable resistance and potential. Example: A volume control is usually a potentiometer.

parts per million (PPM)

Semiconductors; Test equipment

1 in 1,000,000 or 0.000001, (sometimes written as 0.000 001 to emphasize it's sixth digit decimal place). It is used as a measure of the quality of devices. e.g. 100 ppm (that may be indicated as ...

post-production support (PPS)

Semiconductors; Test equipment

The management and support activities necessary to ensure continued attainment of readiness and sustainability objectives with economical logistics support after the cessation of the production phase ...

plastic quad flat pack (PQFP)

Semiconductors; Test equipment

An FP with leads on fours sides. Generally refers to a plastic quad flat package that is built to JEDEC standards.

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