Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

loss of vehicle (LOV)

Semiconductors; Test equipment

The measurement of probability of a failure causing loss of vehicle, platform or equipment and is specified as a level 4 criticality in the FMECA.

hertz

Semiconductors; Test equipment

(lower-case h, but abbreviated Hz) The unit of frequency. Formerly cps for cycles per second.

logistics supports analysis (LSA)

Semiconductors; Test equipment

A systems engineering and design process selectively applied during all life cycle phases of the system/equipment to help ensure supportability objectives are met. (MIL-STD-1785)

logistics supports analysis record (LSAR)

Semiconductors; Test equipment

That portion of LSA documentation consisting of detailed data pertaining to the identification of logistic support resource requirements of an equipment.

large scale integration (LSI)

Semiconductors; Test equipment

Arrays of ICs on a single substrate that comprise 100 or more individual active circuit functions or gates.

long term evolution (LTE)

Semiconductors; Test equipment

The name given to a project within the Third Generation Partnership Project (3GPP) to improve the Universal Mobile Telecommunications System (UMTS) mobile phone standard to cope with future ...

LAN extensions for instrumentation (LXI)

Semiconductors; Test equipment

LAN-based successor to GPIB. it goes beyond GPIB to provide additional capabilities that make it easier for system designers and integrators to create faster, more efficient systems. LXI is an ...