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Test equipment

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Test equipment

peripheral component interconnect (PCI)

Semiconductors; Test equipment

A high-performance expansion bus architecture originally developed by Intel to replace ISA and EISA. It is achieving widespread acceptance as a standard for PCs and workstations; it offers a ...

pulse code modulation (PCM)

Semiconductors; Test equipment

Method of modulation in which analog voice signals are sampled and converted to digital words that are then transmitted serially. Most PCM systems use either 7- or 8-bit binary codes. There are, ...

personal computer memory card international association (PCMCIA)

Semiconductors; Test equipment

A credit card-size device originally designed as a platform for add-on memory for portable computers, but later expanded to include a wide range of peripherals including pagers and radio modems.

personal communication system (PCS)

Semiconductors; Test equipment

PCs is a new lower power high frequency competitive technology to cellular operating at 1.5 to 1.8 Ghz range. It is usually associated with cordless telephone-like devices and PDA devices. Service is ...

personal digital assistant (PDA)

Semiconductors; Test equipment

PDAs are primarily a productivity and communications tool that is lightweight, compact, durable, reliable, easy to use, and integrates into existing operations. PDAs fall into four categories: ...

plan-do-check-act (PDCA)

Semiconductors; Test equipment

This is a basic principle followed for effective problem solving during kaizen.

probability density function (PDF)

Semiconductors; Test equipment

A mathematical model that describes the probability of failure ocurring over time. This function can be utilized to determine the probability that a failure takes place in a given time interval.

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