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Test equipment

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Test equipment

copper foil

Semiconductors; Test equipment

Coated copper layer on the board. It can either be characterized by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...

base copper weight

Semiconductors; Test equipment

Coated copper layer on the board. It can either be characterized by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...

quadrature sensitivity

Semiconductors; Test equipment

(Or side or lateral motion or crosstalk sensitivity) of a vibration sensor is its sensitivity to motion perpendicular to the sensor's principal axis. Commonly expressed in % of principal axis ...

operating system (OS)

Semiconductors; Test equipment

The collective name for the set of master programs that control the core operation and the base-level user-interface of a computer.

organic solder preservative (OSP)

Semiconductors; Test equipment

Layers of organic coatings applied to entire board surfaces to prevent oxidation and to retain solderability.

pico (P)

Semiconductors; Test equipment

Representing one millionth of one millionth = 0.000 000 000 001 or 10 to the -12th power. Typically used for capacitance measurements, such as 5 pF is 5*10^-12 farads.

programmable array logic (PAL)

Semiconductors; Test equipment

A programmable logic device in which the AND array is programmable but the OR array is pre-defined.

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