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Test equipment
Industry: Semiconductors
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Test equipment
copper foil
Semiconductors; Test equipment
Coated copper layer on the board. It can either be characterized by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...
base copper weight
Semiconductors; Test equipment
Coated copper layer on the board. It can either be characterized by weight or thickness of the coated copper layer. For instance, 0.5, 1 and 2 ounces per square foot are equivalent to 18, 35 and 70 ...
quadrature sensitivity
Semiconductors; Test equipment
(Or side or lateral motion or crosstalk sensitivity) of a vibration sensor is its sensitivity to motion perpendicular to the sensor's principal axis. Commonly expressed in % of principal axis ...
operating system (OS)
Semiconductors; Test equipment
The collective name for the set of master programs that control the core operation and the base-level user-interface of a computer.
organic solder preservative (OSP)
Semiconductors; Test equipment
Layers of organic coatings applied to entire board surfaces to prevent oxidation and to retain solderability.
pico (P)
Semiconductors; Test equipment
Representing one millionth of one millionth = 0.000 000 000 001 or 10 to the -12th power. Typically used for capacitance measurements, such as 5 pF is 5*10^-12 farads.
programmable array logic (PAL)
Semiconductors; Test equipment
A programmable logic device in which the AND array is programmable but the OR array is pre-defined.
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