Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

MXI interfaces to everything (MITE)

Semiconductors; Test equipment

A custom ASIC designed by National Instruments that implements the PCI bus interface. The MITE supports bus mastering for high speed data transfers over the PCI bus.

multi layer board (MLB)

Semiconductors; Test equipment

A PWB that has more than two conductor layers. The layers are interconnected by the plated-through holes.

In video transmission over the internet it is a measure of the number of lost—and in some cases out-of-sequence—video data packets per second at the node. It is a convenient format for specifying the ...

microwave multichannel distribution system (MMDS)

Semiconductors; Test equipment

A distribution service for TV signals using microwave transmissions. Also called multichannel video distribution system (MVDS). In the US, it is called "wireless cable".

module ID (MODID)

Semiconductors; Test equipment

A set of 13 signal lines on the VXI backplane that VXI systems use to identify which modules are located in which slots in the mainframe.

microoptoelectromechanical systems (MOEMS)

Semiconductors; Test equipment

MEMS devices that include optic components, such as micromirrors.

method of moments (MOM)

Semiconductors; Test equipment

The MOM technique is commonly used for analysis of radiated electric field emissions caused by common-mode currents on the enclosure/box, connectors, and cables resulting from the PCB emissions.