Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

nanosecond (ns)

Semiconductors; Test equipment

A billionth of a second. Many computer operations, such as the speed of memory chips, are measured in nanoseconds. Nanosecond is often abbreviated as ns.

effective radiated power (ERP)

Semiconductors; Test equipment

The product of a transmitter power output and the antenna gain, taking into consideration any losses from the transmission line, connectors, couplers, etc.

equipment replaceable unit or replaceable unit (ERU)

Semiconductors; Test equipment

The lowest assembly or individual part that can be fault detected, isolated, removed, replaced and verified to be functional at organizational level without disassembly of the equipment to which it ...

electrostatic discharge (ESD)

Semiconductors; Test equipment

A test, whereby, the unit under test subjected to some level of static electricity. Some organisations have their own ESD requirements which hardware must meet and some countries have laws regulating ...

electronic system design automation (ESDA)

Semiconductors; Test equipment

High-level EDA tools used to design and describe entire electronic systems.

environmental stress screening (ESS)

Semiconductors; Test equipment

A post-production process in which 100% of produced units are subjected to stresses more severe than anticipated in service. The object is to precipitate latent defects into recognizable failures, so ...

embedded test controller (ETC)

Semiconductors; Test equipment

If some, or all of the functionality of a runtime-control Test Manager is built into the UUT, then this is referred to as an Embedded Test Controller (ETC), and defined to be the combination of an ...