Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

fine pitch technology (FPT)

Semiconductors; Test equipment

The portion of surface mount technology that included components that typically have lead pitch, or center-to-center spacing, between 0.4mm and 0.8mm.

failure reporting and corrective action system (FRACAS)

Semiconductors; Test equipment

A process by which failures are identified and analyzed so that corrective actions can be implemented back into the design and/or manufacturing process.

frequency response function (FRF)

Semiconductors; Test equipment

The output to input relationship of a structure. Mathematically, it is the Fourier transform of the output divided by the Fourier transform of the input.

At field service, an FRU is the level of sub-assembly that would normally be exchanged to effect a repair, the FRU subsequently being returned to a service depot for repair. Equivalent terms, for the ...

frequency shift keying (FSK)

Semiconductors; Test equipment

modulation scheme for data communications using a limited number of discrete frequencies to convey binary information.

fault tree analysis (FTA)

Semiconductors; Test equipment

An analysis approach in which each potential system failure is traced back to all faults that could cause the failure. It is a top-down approach, whereas the FMEA is a bottom-up approach.