Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

delayed non-return-to-zero (DNRZ)

Semiconductors; Test equipment

A digital format similar to NRZ, except that the waveform switches to a “1” after a specified delay time.

operational dependability ((Do)

Semiconductors; Test equipment

The ratio of the Mean Time Between Critical Failures (MTBCF) over the sum of the MTBCF and the Mean Time to Restore Function (MTTRF). This measure is used to determine the degree to which the system ...

design of experiment (DOE)

Semiconductors; Test equipment

Planning and conducting experiments and evaluating the results. The outcome of a design of experiment includes a mathematical equation predicting the interaction of the factors influencing a process ...

double pole double throw (DPDT)

Semiconductors; Test equipment

A double-pole double-throw (DPDT) relay has two poles, each with two simultaneously controlled throws

data register scan

Semiconductors; Test equipment

(DR scan) - A scan operation that includes shifting new data into test data registers from the TDI buffers and shifting captured data out into the TDO buffers while the TAP controller is in Shift-DR ...

dynamic random access memory (DRAM)

Semiconductors; Test equipment

Memory that consists of small capacitors for each bit of memory. Since capacitors do not hold a charge indefinitely, DRAM must be constantly refreshed to avoid losing its contents. Also, the process ...