32 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
cross coupling
Semiconductors; Test equipment
The coupling of a signal from one channel, circuit, or conductor to another, where it becomes an undesired signal.
defects per million (DPM)
Semiconductors; Test equipment
The defect level expressed as defective parts per million units.
attenuation
Semiconductors; Test equipment
The difference in a signal's voltage, current, or power from when the signal is transmitted to when it is received.
gray scale
Semiconductors; Test equipment
The discrete gray levels that are defined for an imaging system or imaging software. In an eight-bit system, the gray scale runs from 0 to255.
hue
Semiconductors; Test equipment
The distinction between colors. Red, blue, green, and yellow are examples of hues. White, black, and gray are not considered hues because they are intensities, not colors.
skew
Semiconductors; Test equipment
The effect of different propagation delays between signal origins and device pins (or other points, for example, probes).
RS-170
Semiconductors; Test equipment
The encoding standard for 60-Hz black-and-white television signals; it is used as the standard for most monochrome video equipment.
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