Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

small computer system interface (SCSI)

Semiconductors; Test equipment

(pronounced "scuzzy") An eight-bit parallel computer peripheral interface standard used to connect to a wide variety of peripherals devices including hard-disk and CD-ROM drives, tape-backup units, ...

standard deviation (SD)

Semiconductors; Test equipment

A measure of the variability or dispersion of a distribution of scores. The most widely used measure of dispersion of a frequency distribution. It is equal to the positive square root of the ...

scan data input (SDI)

Semiconductors; Test equipment

The Scan Data Input port on a scan cell -- more specifically, the assert side of the input multiplexor when the control signal, SE, is asserted.

scan data output (SDO)

Semiconductors; Test equipment

The dedicated Scan Data Output port on a scan cell, or the connection on the scan cell Q or QB output port used as a dedicated scan connection to another scan cell's SDI port.

scan enable (SE)

Semiconductors; Test equipment

The scan enable port on a scan cell and it's globally routed control signal -- this is the multiplexor control signal that selects whether the scan cell will update with data from the functional D ...

single-event effects (SEE)

Semiconductors; Test equipment

Associated with the change of states or transients in a device that energetic external radiation particles induce. You can classify SEEs into soft and hard errors. Soft errors are nondestructive, ...

serializer / deserializer (SERDES)

Semiconductors; Test equipment

An integrated circuit (IC or chip) transceiver that converts parallel data to serial data and vice-versa. The transmitter section is a serial-to-parallel converter, and the receiver section is a ...