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Test equipment
Industry: Semiconductors
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Test equipment
catastrophic fault
Semiconductors; Test equipment
These are faults such as open and short circuits that cause sudden and large variation in component values.
parametric faults
Semiconductors; Test equipment
These faults are caused by variations in component parameter values produced by process or environmental changes.
fault
Semiconductors; Test equipment
This term is used in reference to classes, or concepts, of defect types. The most common of these is the stuck at type, or fault class. In the EDA and academic worlds, a fault is a software model of ...
compare
Semiconductors; Test equipment
To apply functional data to a comparator and obtain the response.
trace
Semiconductors; Test equipment
To monitor the execution of a program and report the sequence of actions carried out.
format
Semiconductors; Test equipment
To produce a waveform from pattern data and timing information in accordance with a format mode.
mask
Semiconductors; Test equipment
To set a comparator state used to ignore the result of a comparison.
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