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Test equipment
Industry: Semiconductors
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Test equipment
interrupt handler
Semiconductors; Test equipment
The software routine that handles an interrupt's request for service.
waveform
Semiconductors; Test equipment
The succession of signal levels applied to the DUT pin after combining pattern and timing information.
checksum
Semiconductors; Test equipment
The sum of a group of data values. Usually transmitted with the data to assist in error detection.
channel
Semiconductors; Test equipment
The tester functions and the path through a pin-group card and DUT fixture dedicated to one DUT pin.
cycle time
Semiconductors; Test equipment
The time duration from the start of one cycle to the start of the next.
conversion time
Semiconductors; Test equipment
The time required from the moment a channel is interrogated to the moment that accurate data is available. Usually associated with DACs and ADCs.
settling time
Semiconductors; Test equipment
The time required, after rapidly changing a circuit's input signal, for that circuit's output voltage to settle and remain within a specified error band around the final value.
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