Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

multiplexer-D (Mux-D)

Semiconductors; Test equipment

Type of scan design that uses D type flip-flops with input multiplexers to isolate each scan node. This is the most widely used type of scan element.

noise

Semiconductors; Test equipment

Undesirable electrical interference to a signal.

standard test data format (STDF)

Semiconductors; Test equipment

STDF is a standard output format for test results. There are numerous tools for post processing STDF generated files and performing statistical analysis on a population of tested devices.

standard test interface language (STIL)

Semiconductors; Test equipment

STIL is an emerging standard for test development. It is supported as an output format by the ATPGs of most EDA toolsets. None of the ATEs currently support STIL directly, however because STIL is ...

structural testing

Semiconductors; Test equipment

Strategy of testing integrated circuits that focuses on detecting manufacturing defects. Unlike functional or behavioral testing, defects are targeted directly.

self test using MISR and parallel SRSG (STUMPS)

Semiconductors; Test equipment

STUMPS is a common BIST architecture that combines a PRPG (or multiple SRSGs), multiple scan chains, and a MISR.

Term used to reference specific flaw(s); physical or chemical imperfection, on a manufactured device. Most defects can be detected and measured by a Failure Analysis group. Specific devices that do ...