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Test equipment
Industry: Semiconductors
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Test equipment
feature extraction
Semiconductors; Test equipment
A technique that generates a set of descriptors or characteristic attributes from a binary image.
edge detection
Semiconductors; Test equipment
A technique that locates an edge by examining an image for abrupt changes in pixel values.
successive-approximation
Semiconductors; Test equipment
A technique used in ADCs that sequentially compares a series of progressively smaller binary-weighted values with an analog input to produce an output digital word.
frame relay
Semiconductors; Test equipment
A technology for transmitting data packets in high-speed bursts across a digital network.
test vector
Semiconductors; Test equipment
A test vector or test setup condition is a set of stimuli applied to the device-under-test (DUT) to elicit a known output at a given test measurement node.
go/no-go test
Semiconductors; Test equipment
A test with minimum and maximum limits that stops on the first error without performing any diagnostics, characterization, or actual measurements other than limit checking.
Nyquist sampling theorem
Semiconductors; Test equipment
A theorem that states that if you sample a signal at rate f, the sampled signal will contain no information about signals with frequency components above f/2.
