Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

feature extraction

Semiconductors; Test equipment

A technique that generates a set of descriptors or characteristic attributes from a binary image.

edge detection

Semiconductors; Test equipment

A technique that locates an edge by examining an image for abrupt changes in pixel values.

successive-approximation

Semiconductors; Test equipment

A technique used in ADCs that sequentially compares a series of progressively smaller binary-weighted values with an analog input to produce an output digital word.

frame relay

Semiconductors; Test equipment

A technology for transmitting data packets in high-speed bursts across a digital network.

test vector

Semiconductors; Test equipment

A test vector or test setup condition is a set of stimuli applied to the device-under-test (DUT) to elicit a known output at a given test measurement node.

go/no-go test

Semiconductors; Test equipment

A test with minimum and maximum limits that stops on the first error without performing any diagnostics, characterization, or actual measurements other than limit checking.

Nyquist sampling theorem

Semiconductors; Test equipment

A theorem that states that if you sample a signal at rate f, the sampled signal will contain no information about signals with frequency components above f/2.