Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

soft fault

Semiconductors; Test equipment

Any fault caused by a parametric or process variation outside of tolerance or nominal values is called a soft fault.

parametric fault

Semiconductors; Test equipment

Any fault caused by a parametric or process variation outside of tolerance or nominal values is called a soft fault.

subpixel resolution

Semiconductors; Test equipment

Any imaging technique that can yield a measurement with a spatial resolution of less than one pixel.

Any mechanism for isolating a core's inputs from the surrounding circuitry, such that the core completely ignores these inputs. This may be useful while testing the surrounding circuitry to prevent ...

output isolation

Semiconductors; Test equipment

Any mechanism for isolating a core's outputs from the surrounding circuitry, such that the surrounding circuitry may be tested without contention from the cores not under test.

functional perturbation

Semiconductors; Test equipment

At the output of a functional macro (for example, a sub-circuit such as an amplifier), functional perturbation represents the deviation of the output from its nominal value due to a soft or hard ...