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Test equipment

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Test equipment

active filter

Semiconductors; Test equipment

An electronic filter that combines active circuit devices, usually operational amplifiers, with resistors and capacitors. Typically, active filters more closely match ideal filters than passive ...

broadband emission

Semiconductors; Test equipment

An emission that has a spectral energy distribution that is sufficiently broad, uniform, and continuous to ensure that a measuring receiver's response does not vary significantly when tuned over a ...

anechoic chamber

Semiconductors; Test equipment

An enclosure especially designed with walls that absorb sound or radiation, creating an essentially free-field environment for testing.

time-out

Semiconductors; Test equipment

An error event that occurs after a maximum time interval for an expected event.

monochrome

Semiconductors; Test equipment

An image represented by a single color. Generally, a monochrome image is presented as white on a black background.

flaw detection

Semiconductors; Test equipment

An image-analysis technique that examines an object for unwanted features of unknown shapes at unknown positions.

area analysis

Semiconductors; Test equipment

An image-analysis technique that finds the area in an image that falls within a range of specific gray levels.

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