Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

interrupt vector

Semiconductors; Test equipment

A type of interrupt that immediately points a computer to a new series of instructions.

argument

Semiconductors; Test equipment

A value or address passed to a function at the time of call; also referred to as actual parameter.

composite sync

Semiconductors; Test equipment

A video signal that contains horizontal-sync pulses, vertical-sync pulses, and equalizing pulses only, with a no-signal reference level.

red-green-blue (RGB)

Semiconductors; Test equipment

A video-display standard in which three separate signals red, green, and blue transmit image information.

design rules

Semiconductors; Test equipment

Allowable dimensions used in the layout and design of an integrated circuit. Such rules are specific to different types of ICs.

functional testing

Semiconductors; Test equipment

Also known as behavioral testing. Strategy of testing integrated circuits that focuses on the expected functionality of the circuit. Defects are targeted in an indirect way. The test methodology ...

multiple input shift register (MISR)

Semiconductors; Test equipment

Also known as Multiple Input Signature Register. MISRs are simply LFSRs configured as signature analyzers. MISRs are often used on the back end of BIST engines to capture and compress output ...