Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

scan

Semiconductors; Test equipment

DFT technique where traditional functional logic is reconfigured into "chains" for direct test access to internal nodes.

fault dominance

Semiconductors; Test equipment

Dominance is the condition in which the deviation at the output caused by one fault is negligible compare with the deviation at the same output, but caused by a different fault.

conducted emission

Semiconductors; Test equipment

Electromagnetic energy that is propagated along a conductor. This energy is called "conducted interference" if it is undesired.

electronic design automation (EDA)

Semiconductors; Test equipment

EDA refers to the design tools and environment utilized to render the logic, schematics, insert scan, insert BIST, etc. for a new chip design.

P1500

Semiconductors; Test equipment

Emerging IEEE standard for test wrappers (common -scan like test structures "wrapped around SOC cores).

genlock

Semiconductors; Test equipment

Extraction of horizontal-sync and vertical-sync signals from a video signal and the use of those signals to synchronize video equipment.

transition delay

Semiconductors; Test equipment

Fault characterized by a particular gate or gate connection being too slow-to-rise or too slow-to-fall to meet the overall timing requirements of a circuit.