Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

pseudo- random pattern generator (PRPG)

Semiconductors; Test equipment

PRPGs are LFSRs that are sometimes used on the front end of BIST engines to generate pseudo-random patterns to be presented to a circuit under test.

system on a chip (SOC)

Semiconductors; Test equipment

Practice of integrating one or more processor cores, embedded memories, peripheral interfaces, and sometimes mixed signal circuits onto a single chip to form a complete (or nearly complete) system.

verilog change dump (VCD)

Semiconductors; Test equipment

Output from Verilog used for pattern generation. Typically this output has to be translated into a format that is readable by a tester. This translation process is typically performed by several ...

wafer level burn in (WLBI)

Semiconductors; Test equipment

Wafer Level Burn In is a manufacturing technique where a particular product is burned in as full wafers to take advantage of massive parallelism and higher temperature acceleration factors.

waveform generation language (WGL)

Semiconductors; Test equipment

WGL is the de-facto standard for ATPG and vector generation. Most pattern development tools support WGL and there are third party tools that specialize in the conversion of WGL to various tester ...

automatic built in self test (ABIST)

Semiconductors; Test equipment

1) A form of memory BIST for embedded memories. 2) A form of BIST targeted at testing analog circuits.

guard band

Semiconductors; Test equipment

1. (device testing) Adjustment made to a DUT’s test specification to take into account test-system accuracy, repeatability, reproducibility, and correlation.