15 Terms
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Test equipment
Industry: Semiconductors
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Test equipment
X.25
Semiconductors; Test equipment
A CCIT standard that describes how a switched-packet network handles data.
monotonicity
Semiconductors; Test equipment
A characteristic of a properly operating DAC in which the analog output increases as the digital code input to it increases.
DUT fixture
Semiconductors; Test equipment
A circuit board that interfaces the test head to a device-under-test (DUT) socket, a probe card, or a connector for a device handler. It has pads to mate with the pogo pins on the pin-group cards in ...
sample and hold (S/H)
Semiconductors; Test equipment
A circuit that acquires an analog voltage and stores it temporarily in a capacitor. This circuit is also referred to as a sample-and-hold amplifier (SHA).
event counter
Semiconductors; Test equipment
A circuit that counts the occurrences of a certain condition.
comparator
Semiconductors; Test equipment
A circuit whose output is a digital logic level that depends on whether its input signal is above or below a threshold at a specified time interval.
library
Semiconductors; Test equipment
A collection of routines, data, or other material in a file from which a user can draw for use in a project such as a test program.
