Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

diagnostic routine

Semiconductors; Test equipment

(1) A logical sequence of tests designed to locate a qalfunction of the UUT. (2) The software to perform these tests.

malfunction

Semiconductors; Test equipment

(1) A physical condition that causes a device, a component, or an element to fail to perform in a required manner; for example, a short or open circuit or an intermittent connection. (2) A ...

counter

Semiconductors; Test equipment

(1) In software, a memory location used to store a count of certain occurrences. (2) In hardware, a circuit that counts events.

(1) The ability of systems, units or forces to provide services to and accept services from other systems, units or forces and to use the services so exchanged to enable them to operate effectively ...

false alarm rate

Semiconductors; Test equipment

(1) The number of false alarms per unit time or other life units (for example, sorties). (2) Number of false alarms per BIT alarms expressed as a percentage.

lead

Semiconductors; Test equipment

(1)A metallic element (chemical symbol Pb). (2)A metal conductor used to provide a connection from the inside of a device package to the outside world for soldering or other mounting techniques. ...

electromigration

Semiconductors; Test equipment

(1)A process in which structures on an integrated circuit's substrate are eroded by the flow of electrons in much the same way as land is eroded by a river (also known as subatomic erosion). (2)The ...