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Test equipment

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Test equipment

advanced boolean expression language (ABEL)

Semiconductors; Test equipment

An early hardware description language developed for PLD-based designs.

analog built In self test (ABIST)

Semiconductors; Test equipment

A form of BIST targeted at testing analog circuits.

array built In self test (ABIST)

Semiconductors; Test equipment

A form of memory BIST for embedded memories.

alternating current (AC)

Semiconductors; Test equipment

An electric current that rises to a maximum in one direction, falls back to zero and then rises to a maximum in the opposite direction and then repeats.

acknowledge (ACK)

Semiconductors; Test equipment

In a multipoint tester the ACK signal is used to verify that the communication command was received.

analog to digital converter (ADC)

Semiconductors; Test equipment

A circuit used to convert ana analog signal into the digital equivalent of that signal.

application development environment (ADE)

Semiconductors; Test equipment

An environment which provides users various software development tools for the development of automated test systems. Examples of ADEs include National Instruments LabVIEW, Agilent VEE, Microsoft ...

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