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Test equipment
Industry: Semiconductors
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Test equipment
atto sense and switch unit (ASU)
Semiconductors; Test equipment
A special module that works with a high resolution SMU to obtain current measurement resolution of 0.1 fA. The ASU also has a switching capability that allows it to switch between its SMU connection ...
automatic (automated) test equipment (ATE)
Semiconductors; Test equipment
A collection of stimulus, measuring and switching equipment where the control and decision processes are performed by a computer that is typically preprogrammed to test a particular unit under test.
abbreviated test language for all systems (ATLAS)
Semiconductors; Test equipment
A standard test programming language developed by the IEEE and maintained under various standards, such as IEE Std. 416 and 716. ATLAS 2000 also exists.
automatic test markup language (ATML)
Semiconductors; Test equipment
ATML defines a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. ...
american wire gage (AWG)
Semiconductors; Test equipment
A gauge that assigns a number value to the diameter of a wire.
arbitrary waveform generator (AWG)
Semiconductors; Test equipment
An *Arb* often uses a real-world signal, previously captured by a digital oscilloscope, as the starting point to create a single-cycle waveform.
magnetic flux density (B)
Semiconductors; Test equipment
Tesla (T) = 1 weber/m2 = 104 gauss. 1 gauss = 1 line/cm2 = 1 maxwell/cm2 = 7.936 x 105 A/m.
