Test equipment

Test equipment

Industry: Semiconductors

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Test equipment

delay factor (DF)

Semiconductors; Test equipment

In video transmission over the internet, it measures the imbalance between the rate of video data arrival at a node and the nominal departure rate (the drain rate) over some specified interval. It is ...

intrinsic adhesion energy test

Semiconductors; Test equipment

This is an advanced Hesiometer test. Methods have been developed to eliminate blade edge effects, substrate frictional loss, and the adherent deformation energy from the total energy consumed in ...

availability, operational (AO)

Semiconductors; Test equipment

The ratio of operational “up time” to “down time” measured as MTBF over MTBF + MTTR + MLDT. Where AI is the inherent design capability, AO reflects the ability to return a failed item to the ...

automated optical inspection (AOI)

Semiconductors; Test equipment

Machine vision systems used for automated inspection of shorts and opens in production environments.

algorithmic pattern generation (APG)

Semiconductors; Test equipment

Tester resource that generates vectors on-the-fly, programmatically (algorithmically) , usually for memory test.

application programming interface (API)

Semiconductors; Test equipment

The interface (calling conventions) by which an application program accesses operating system and other services. An API is defined at source code level and provides a level of abstraction between ...